Semiconductor device and method for producing semiconductor device

ABSTRACT

The present invention provides a memory structure including a resistance-changing storage element, which enables a reset operation with a reset gate and in which cross-sectional areas of a resistance-changing film and a lower electrode in a current-flowing direction can be decreased. The semiconductor device of the present invention comprises a first pillar-shaped semiconductor layer, a gate insulating film formed around the first pillar-shaped semiconductor layer, a gate electrode made of a metal and formed around the gate insulating film, a gate line made of a metal and connected to the gate electrode, a second gate insulating film formed around an upper portion of the first pillar-shaped semiconductor layer, a first contact made of a second metal and formed around the second gate insulating film, a second contact which is made of a third metal and which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer, a second diffusion layer formed in a lower portion of the first pillar-shaped semiconductor layer, a pillar-shaped insulating layer formed on the second contact, a resistance-changing film formed around an upper portion of the pillar-shaped insulating layer, a lower electrode formed around a lower portion of the pillar-shaped insulating layer and connected to the resistance-changing film, a reset gate insulating film that surrounds the resistance-changing film, and a reset gate that surrounds the reset gate insulating film.

RELATED APPLICATIONS

This application is continuation application of U.S. patent application Ser. No. 14/487,847, filed Sep. 16, 2014, which is a continuation of International Application No. PCT/JP2013/081543 filed on Nov. 22, 2013, the entire content of which are incorporated herein by reference.

TECHNICAL FIELD

The present invention relates to a semiconductor device and a method for producing a semiconductor device.

BACKGROUND ART

In recent years, a phase-change memory has been developed (e.g., refer to PTL 1). A phase-change memory stores information by changing and recording the resistance of an information memory element of a memory cell.

This is caused by a mechanism in which, when an electric current is caused to flow between a bit line and a source line by turning ON a cell transistor, heat is generated by a high-resistance element serving as a heater, chalcogenide glass (GST: Ge₂Sb₂Te₅) that is in contact with the heater is melted, and a state transition occurs. When chalcogenide glass is melted at high temperature (high current) and cooled rapidly (the application of an electric current is stopped), the chalcogenide glass is brought into an amorphous state (reset operation). When chalcogenide glass is melted at relatively-low high temperature (low current) and cooled slowly (the amount of an electric current is gradually decreased), the chalcogenide glass is crystallized (set operation). Thus, in the readout, information of “0” or information of “1” is determined in accordance with the case where the amount of an electric current that flows between the bit line and the source line is large (low resistance, that is, crystalline state) or the case where the amount is small (high resistance, that is, amorphous state) (e.g., refer to PTL 1).

In this case, the reset current is very high, namely, 200 μA. To cause such a high reset current to flow through the cell transistor, the size of a memory cell needs to be considerably large. To cause a high current to flow, a selection element such as a bipolar transistor or a diode can be used (e.g., refer to PTL 1).

Diodes are two-terminal elements. Therefore, in the selection of memory cells, if a single source line is selected, electric currents of all memory cells connected to the single source line flow through the single source line. As a result, the IR drop increases due to the resistance of the source line.

Bipolar transistors are three-terminal elements. In bipolar transistors, an electric current flows through a gate and thus it is difficult to connect many transistors to word lines.

When the cross-sectional areas of a GST film and a heater element in a current-flowing direction are decreased, the reset current and the read current can be decreased. The cross-sectional areas of a GST film and a heater element in a current-flowing direction have been conventionally decreased by forming a heater element on a side wall of a gate of a planar transistor and forming a GST film in an upper portion of the gate. In this method, a cell string constituted by planar transistors is required (e.g., refer to PTL 1).

A surrounding gate transistor (hereafter referred to as “SGT”) having a structure in which a source, a gate, and a drain are arranged vertically with respect to a substrate and a gate electrode surrounds a pillar-shaped semiconductor layer has been proposed (e.g., refer to PTL 2). Since a source, a gate, and a drain are arranged vertically with respect to a substrate, a small cell area can be realized.

In known MOS transistors, a metal gate-last process in which a metal gate is formed after a high-temperature process has been employed in actual products in order to perform both a metal gate process and a high-temperature process (e.g., refer to NPL 1). A polysilicon gate is formed, an interlayer insulating film is deposited, the polysilicon gate is exposed by performing chemical mechanical polishing, the polysilicon gate is etched, and then a metal is deposited. Therefore, in order to perform both the metal gate process and the high-temperature process, such a metal gate-last process in which a metal gate is formed after a high-temperature process also needs to be employed in SGTs.

In the metal gate-last process, a polysilicon gate is formed and then a diffusion layer is formed by ion implantation. In SGTs, an upper portion of a pillar-shaped silicon layer is covered with a polysilicon gate, and thus some schemes are required.

As the width of a silicon pillar decreases, it becomes more difficult to make an impurity be present in the silicon pillar because the density of silicon is 5×10²²/cm³.

In known SGTs, it has been proposed that the channel concentration is set to be a low impurity concentration of 10¹⁷ cm⁻³ or less and the threshold voltage is determined by changing the work function of a gate material (e.g., refer to PTL 3).

It has been disclosed that, in planar MOS transistors, the sidewall of an LDD region is formed of a polycrystalline silicon having the same conductivity type as a low-concentration layer, surface carriers of the LDD region are induced by the difference in work function, and thus the impedance of the LDD region can be reduced compared with LDD MOS transistors with an oxide film sidewall (e.g., refer to PTL 4). It has also been disclosed that the polycrystalline silicon sidewall is electrically insulated from a gate electrode. The drawings show that the polycrystalline silicon sidewall is insulated from a source and a drain by an interlayer insulating film.

CITATION LIST Patent Literature

-   PTL 1: Japanese Unexamined Patent Application Publication No.     2012-204404 -   PTL 2: Japanese Unexamined Patent Application Publication No.     2004-356314 -   PTL 3: Japanese Unexamined Patent Application Publication No.     2004-356314 -   PTL 4: Japanese Unexamined Patent Application Publication No.     11-297984

Non Patent Literature

-   NPL 1: IEDM 2007 K. Mistry et. al, pp 247-250

SUMMARY OF THE INVENTION

Accordingly, it is an object to provide a memory structure including a resistance-changing storage element, which enables a reset operation with a reset gate and in which cross-sectional areas of a resistance-changing film and a lower electrode in a current-flowing direction can be decreased, and a method for producing the memory structure.

A semiconductor device of the present invention includes a first pillar-shaped semiconductor layer, a first gate insulating film formed around the first pillar-shaped semiconductor layer, a gate electrode made of a metal and formed around the first gate insulating film, a gate line made of a metal and connected to the gate electrode, a second gate insulating film formed around an upper portion of the first pillar-shaped semiconductor layer, a first contact made of a second metal and formed around the second gate insulating film, a second contact which is made of a third metal and which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer, a second diffusion layer formed in a lower portion of the first pillar-shaped semiconductor layer, a pillar-shaped insulating layer formed on the second contact, a resistance-changing film formed around an upper portion of the pillar-shaped insulating layer, a lower electrode formed around a lower portion of the pillar-shaped insulating layer and connected to the resistance-changing film, a reset gate insulating film that surrounds the resistance-changing film, and a reset gate that surrounds the reset gate insulating film.

The pillar-shaped insulating layer is constituted by a nitride film, and the lower electrode is present between the pillar-shaped insulating layer and the second contact.

The reset gate is made of titanium nitride.

The reset gate insulating film is a nitride film.

The lower electrode is made of titanium nitride.

The resistance-changing film is reset by causing an electric current to flow through the reset gate.

The second metal of the first contact has a work function of 4.0 eV to 4.2 eV.

The second metal of the first contact has a work function of 5.0 eV to 5.2 eV.

The semiconductor device includes a fin-shaped semiconductor layer formed on a semiconductor substrate and a first insulating film formed around the fin-shaped semiconductor layer, wherein the first pillar-shaped semiconductor layer is formed on the fin-shaped semiconductor layer, the first gate insulating film is formed around the gate electrode and the gate line and on bottom portions of the gate electrode and the gate line, the gate line extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends, and the second diffusion layer is further formed in the fin-shaped semiconductor layer.

The second diffusion layer is further formed in the semiconductor substrate.

The semiconductor device includes a contact line which is parallel to the gate line and is connected to the second diffusion layer.

The semiconductor device includes the fin-shaped semiconductor layer formed on the semiconductor substrate, the first insulating film formed around the fin-shaped semiconductor layer, a second pillar-shaped semiconductor layer formed on the fin-shaped semiconductor layer, and a contact electrode made of a metal and formed around the second pillar-shaped semiconductor layer, wherein the contact line is made of a metal and extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer connected to the contact electrode extends, the second diffusion layer is formed in the fin-shaped semiconductor layer and in a lower portion of the second pillar-shaped semiconductor layer, and the contact electrode is connected to the second diffusion layer.

An outer width of the gate electrode is equal to a width of the gate line, and a width of the first pillar-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends is equal to a width of the fin-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends.

The first gate insulating film is formed between the second pillar-shaped semiconductor layer and the contact electrode.

A width of the second pillar-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends is equal to a width of the fin-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends.

The first gate insulating film is formed around the contact electrode and the contact line.

An outer width of the contact electrode is equal to a width of the contact line.

The first pillar-shaped semiconductor layer is formed on a semiconductor substrate, the first gate insulating film is formed around the gate electrode and the gate line and on bottom portions of the gate electrode and the gate line, and the second diffusion layer is further formed in the semiconductor substrate.

A method for producing a semiconductor device according to the present invention includes a first step of forming a fin-shaped semiconductor layer on a semiconductor substrate and forming a first insulating film around the fin-shaped semiconductor layer; after the first step, a second step of forming a first pillar-shaped semiconductor layer, a first dummy gate constituted by a first polysilicon, a second pillar-shaped semiconductor layer, and a second dummy gate constituted by a first polysilicon; after the second step, a third step of forming a third dummy gate and a fourth dummy gate on side walls of the first dummy gate, the first pillar-shaped semiconductor layer, the second dummy gate, and the second pillar-shaped semiconductor layer; after the third step, a fourth step of forming a second diffusion layer in an upper portion of the fin-shaped semiconductor layer, a lower portion of the first pillar-shaped semiconductor layer, and a lower portion of the second pillar-shaped semiconductor layer; after the fourth step, a fifth step of depositing an interlayer insulating film, exposing upper portions of the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, forming a gate insulating film around the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer, removing a portion of the gate insulating film located in a periphery of a bottom portion of the second pillar-shaped semiconductor layer, depositing a first metal, exposing an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, forming a gate electrode and a gate line around the first pillar-shaped semiconductor layer, and forming a contact electrode and a contact line around the second pillar-shaped semiconductor layer; after the fifth step, a sixth step of depositing a second gate insulating film around the first pillar-shaped semiconductor layer, on the gate electrode and the gate line, around the second pillar-shaped semiconductor layer, and on the contact electrode and the contact line, depositing a second metal, exposing an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, removing a portion of the second gate insulating film on the first pillar-shaped semiconductor layer, depositing a third metal, and etching portions of the third metal and the second metal to form a first contact in which the second metal surrounds an upper side wall of the first pillar-shaped semiconductor layer and a second contact which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer; and after the sixth step, a seventh step of depositing a second interlayer insulating film, forming a contact hole, depositing a fourth metal and a nitride film, removing portions of the fourth metal and the nitride film on the second interlayer insulating film to form a pillar-shaped nitride film layer and a lower electrode in the contact hole, the lower electrode surrounding a bottom portion of the pillar-shaped nitride film layer and the pillar-shaped nitride film layer, etching back the second interlayer insulating film to expose an upper portion of the lower electrode that surrounds the pillar-shaped nitride film layer, removing the exposed upper portion of the lower electrode that surrounds the pillar-shaped nitride film layer, depositing a resistance-changing film so that the resistance-changing film surrounds the pillar-shaped nitride film layer and is connected to the lower electrode, etching the resistance-changing film to make the resistance-changing film remain as a side wall on an upper portion of the pillar-shaped nitride film layer, forming a reset gate insulating film so that the reset gate insulating film surrounds the resistance-changing film, and forming a reset gate.

The second step includes forming a second insulating film around the fin-shaped semiconductor layer; depositing a first polysilicon on the second insulating film and planarizing the first polysilicon; forming a second resist for forming a first gate line, a first pillar-shaped semiconductor layer, a first contact line, and a second pillar-shaped semiconductor layer so that the second resist extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends; and etching the first polysilicon, the second insulating film, and the fin-shaped semiconductor layer to form a first pillar-shaped semiconductor layer, a first dummy gate constituted by the first polysilicon, a second pillar-shaped semiconductor layer, and a second dummy gate constituted by the first polysilicon.

The method for producing a semiconductor device further includes, after depositing the first polysilicon on the second insulating film and planarizing the first polysilicon, forming a third insulating film on the first polysilicon.

The method for producing a semiconductor device includes a third step of, after the second step, forming a fourth insulating film around the first pillar-shaped semiconductor layer, the second pillar-shaped semiconductor layer, the first dummy gate, and the second dummy gate, depositing a second polysilicon around the fourth insulating film, and forming a third dummy gate and a fourth dummy gate by etching the second polysilicon so that the second polysilicon is left on side walls of the first dummy gate, the first pillar-shaped semiconductor layer, the second dummy gate, and the second pillar-shaped semiconductor layer.

The method for producing a semiconductor device includes a fourth step of forming a second diffusion layer in an upper portion of the fin-shaped semiconductor layer and lower portions of the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer, forming a fifth insulating film around the third dummy gate and the fourth dummy gate, etching the fifth insulating film to make the fifth insulating film remain as a side wall, and forming a metal and semiconductor compound in an upper portion of the second diffusion layer.

The method for producing a semiconductor device includes a fifth step of, after the fourth step, depositing an interlayer insulating film, performing chemical mechanical polishing to expose upper portions of the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the second insulating film and the fourth insulating film, forming a gate insulating film around the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer and on an inner side of the fifth insulating film, forming a third resist for removing a portion of the gate insulating film located in a periphery of a bottom portion of the second pillar-shaped semiconductor layer, removing the portion of the first gate insulating film located in the periphery of the bottom portion of the second pillar-shaped semiconductor layer, and depositing a first metal and etching back the first metal to expose an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, to form a gate electrode and a gate line around the first pillar-shaped semiconductor layer, and to form a contact electrode and a contact line around the second pillar-shaped semiconductor layer.

According to the present invention, there can be provided a memory structure including a resistance-changing storage element, which enables a reset operation with a reset gate and in which cross-sectional areas of a resistance-changing film and a lower electrode in a current-flowing direction can be decreased, and a method for producing the memory structure.

When the pillar-shaped insulating layer formed on the second contact, the resistance-changing film formed around an upper portion of the pillar-shaped insulating layer, the lower electrode formed around a lower portion of the pillar-shaped insulating layer and connected to the resistance-changing film, the reset gate insulating film that surrounds the resistance-changing film, and the reset gate that surrounds the reset gate insulating film are included, heat is generated in the reset gate serving as a heater as a result of current flow through the reset gate. This melts chalcogenide glass (GST: Ge₂Sb₂Te₅), which is the resistance-changing film that is in contact with the heater, and thus a state transition occurs.

Since the reset gate surrounds the resistance-changing film, the resistance-changing film is easily heated.

Since a reset operation is performed as a result of current flow through the reset gate, a high current is not necessarily caused to flow through a selection element. The selection element may be a selection element through which only a low current for a set operation can be caused to flow.

When the pillar-shaped insulating layer, the resistance-changing film formed around an upper portion of the pillar-shaped insulating layer, and the lower electrode formed around a lower portion of the pillar-shaped insulating layer and connected to the resistance-changing film are included, the cross-sectional areas of a phase-change film, which is the resistance-changing film, and a heater element, which is the lower electrode, in a current-flowing direction can be decreased.

The pillar-shaped insulating layer is a nitride film, and thus the cooling of the phase-change film can be accelerated. The lower electrode is present below the pillar-shaped insulating layer, and thus the contact resistance between the lower electrode and a selection transistor can be decreased.

The second gate insulating film formed around the upper portion of the pillar-shaped semiconductor layer, the first contact made of a second metal and formed around the second gate insulating film, and the second contact which is made of a third metal and which connects the upper portion of the first contact to the upper portion of the pillar-shaped semiconductor layer can provide an SGT having a structure in which the upper portion of the pillar-shaped semiconductor layer is made to function as an n-type semiconductor layer or a p-type semiconductor layer by a difference in work function between metal and semiconductor. Thus, a step of forming a diffusion layer in the upper portion of the pillar-shaped semiconductor layer is omitted.

The gate electrode is made of a metal and the gate line is made of a metal. Furthermore, there are the first contact made of a metal and formed around the second gate insulating film and the second contact that connects the upper portion of the first contact to the upper portion of the pillar-shaped semiconductor layer. Since a large amount of metal is used, the cooling can be accelerated. In addition, since the gate insulating film is formed around the gate electrode and the gate line and on bottom portions of the gate electrode and the gate line, a metal gate is formed through a gate-last process. Therefore, both a metal gate process and a high-temperature process can be performed.

The semiconductor device includes a fin-shaped semiconductor layer formed on a semiconductor substrate, a first insulating film formed around the fin-shaped semiconductor layer, the first pillar-shaped semiconductor layer formed on the fin-shaped semiconductor layer, and the gate insulating film formed around the gate electrode and the gate line and on bottom portions of the gate electrode and the gate line. The gate electrode is made of a metal and the gate line is made of a metal, the gate line extending in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends. The second diffusion layer is further formed in the fin-shaped semiconductor layer. The outer width of the gate electrode is equal to the width of the gate line. The width of the first pillar-shaped semiconductor layer is equal to the width of the fin-shaped semiconductor layer. Thus, the fin-shaped semiconductor layer, the pillar-shaped semiconductor layer, the gate electrode, and the gate line of this semiconductor device are formed through a self-aligned process with two masks. This can reduce the number of steps.

The presence of the contact line which is parallel to the gate line and is connected to the second diffusion layer can reduce the resistance of a source line and can suppress an increase in the source voltage caused by electric current at the time of the set operation. Regarding the contact line which is parallel to the gate line, one contact line is preferably disposed for every 2 memory cells, 4 memory cells, 8 memory cells, 16 memory cells, 32 memory cells, or 64 memory cells arranged in a row in a direction in which the bit line extends.

A structure constituted by the second pillar-shaped semiconductor layer, the contact electrode formed around the second pillar-shaped semiconductor layer, and the contact line is the same as a transistor structure, except that the contact electrode is connected to the second diffusion layer. All source lines which extend in a direction parallel to a direction in which the gate line extends are connected to the contact line. This can reduce the number of steps.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1(a) is a plan view of a semiconductor device according to the present invention. FIG. 1(b) is a sectional view taken along line X-X′ of FIG. 1(a). FIG. 1(c) is a sectional view taken along line Y-Y′ of FIG. 1(a).

FIG. 2(a) is a plan view of a semiconductor device according to the present invention. FIG. 2(b) is a sectional view taken along line X-X′ of FIG. 2(a). FIG. 2(c) is a sectional view taken along line Y-Y′ of FIG. 2(a).

FIG. 3(a) is a plan view of a semiconductor device according to the present invention. FIG. 3(b) is a sectional view taken along line X-X′ of FIG. 3(a). FIG. 3(c) is a sectional view taken along line Y-Y′ of FIG. 3(a).

FIG. 4(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 4(b) is a sectional view taken along line X-X′ of FIG. 4(a). FIG. 4(c) is a sectional view taken along line Y-Y′ of FIG. 4(a).

FIG. 5(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 5(b) is a sectional view taken along line X-X′ of FIG. 5(a). FIG. 5(c) is a sectional view taken along line Y-Y′ of FIG. 5(a).

FIG. 6(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 6(b) is a sectional view taken along line X-X′ of FIG. 6(a). FIG. 6(c) is a sectional view taken along line Y-Y′ of FIG. 6(a).

FIG. 7(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 7(b) is a sectional view taken along line X-X′ of FIG. 7(a). FIG. 7(c) is a sectional view taken along line Y-Y′ of FIG. 7(a).

FIG. 8(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 8(b) is a sectional view taken along line X-X′ of FIG. 8(a). FIG. 8(c) is a sectional view taken along line Y-Y′ of FIG. 8(a).

FIG. 9(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 9(b) is a sectional view taken along line X-X′ of FIG. 9(a). FIG. 9(c) is a sectional view taken along line Y-Y′ of FIG. 9(a).

FIG. 10(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 10(b) is a sectional view taken along line X-X′ of FIG. 10(a). FIG. 10(c) is a sectional view taken along line Y-Y′ of FIG. 10(a).

FIG. 11(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 11(b) is a sectional view taken along line X-X′ of FIG. 11(a). FIG. 11(c) is a sectional view taken along line Y-Y′ of FIG. 11(a).

FIG. 12(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 12(b) is a sectional view taken along line X-X′ of FIG. 12(a). FIG. 12(c) is a sectional view taken along line Y-Y′ of FIG. 12(a).

FIG. 13(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 13(b) is a sectional view taken along line X-X′ of FIG. 13(a). FIG. 13(c) is a sectional view taken along line Y-Y′ of FIG. 13(a).

FIG. 14(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 14(b) is a sectional view taken along line X-X′ of FIG. 14(a). FIG. 14(c) is a sectional view taken along line Y-Y′ of FIG. 14(a).

FIG. 15(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 15(b) is a sectional view taken along line X-X′ of FIG. 15(a). FIG. 15(c) is a sectional view taken along line Y-Y′ of FIG. 15(a).

FIG. 16(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 16(b) is a sectional view taken along line X-X′ of FIG. 16(a). FIG. 16(c) is a sectional view taken along line Y-Y′ of FIG. 16(a).

FIG. 17(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 17(b) is a sectional view taken along line X-X′ of FIG. 17(a). FIG. 17(c) is a sectional view taken along line Y-Y′ of FIG. 17(a).

FIG. 18(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 18(b) is a sectional view taken along line X-X′ of FIG. 18(a). FIG. 18(c) is a sectional view taken along line Y-Y′ of FIG. 18(a).

FIG. 19(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 19(b) is a sectional view taken along line X-X′ of FIG. 19(a). FIG. 19(c) is a sectional view taken along line Y-Y′ of FIG. 19(a).

FIG. 20(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 20(b) is a sectional view taken along line X-X′ of FIG. 20(a). FIG. 20(c) is a sectional view taken along line Y-Y′ of FIG. 20(a).

FIG. 21(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 21(b) is a sectional view taken along line X-X′ of FIG. 21(a). FIG. 21(c) is a sectional view taken along line Y-Y′ of FIG. 21(a).

FIG. 22(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 22(b) is a sectional view taken along line X-X′ of FIG. 22(a). FIG. 22(c) is a sectional view taken along line Y-Y′ of FIG. 22(a).

FIG. 23(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 23(b) is a sectional view taken along line X-X′ of FIG. 23(a). FIG. 23(c) is a sectional view taken along line Y-Y′ of FIG. 23(a).

FIG. 24(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 24(b) is a sectional view taken along line X-X′ of FIG. 24(a). FIG. 24(c) is a sectional view taken along line Y-Y′ of FIG. 24(a).

FIG. 25(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 25(b) is a sectional view taken along line X-X′ of FIG. 25(a). FIG. 25(c) is a sectional view taken along line Y-Y′ of FIG. 25(a).

FIG. 26(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 26(b) is a sectional view taken along line X-X′ of FIG. 26(a). FIG. 26(c) is a sectional view taken along line Y-Y′ of FIG. 26(a).

FIG. 27(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 27(b) is a sectional view taken along line X-X′ of FIG. 27(a). FIG. 27(c) is a sectional view taken along line Y-Y′ of FIG. 27(a).

FIG. 28(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 28(b) is a sectional view taken along line X-X′ of FIG. 28(a). FIG. 28(c) is a sectional view taken along line Y-Y′ of FIG. 28(a).

FIG. 29(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 29(b) is a sectional view taken along line X-X′ of FIG. 29(a). FIG. 29(c) is a sectional view taken along line Y-Y′ of FIG. 29(a).

FIG. 30(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 30(b) is a sectional view taken along line X-X′ of FIG. 30(a). FIG. 30(c) is a sectional view taken along line Y-Y′ of FIG. 30(a).

FIG. 31(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 31(b) is a sectional view taken along line X-X′ of FIG. 31(a). FIG. 31(c) is a sectional view taken along line Y-Y′ of FIG. 31(a).

FIG. 32(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 32(b) is a sectional view taken along line X-X′ of FIG. 32(a). FIG. 32(c) is a sectional view taken along line Y-Y′ of FIG. 32(a).

FIG. 33(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 33(b) is a sectional view taken along line X-X′ of FIG. 33(a). FIG. 33(c) is a sectional view taken along line Y-Y′ of FIG. 33(a).

FIG. 34(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 34(b) is a sectional view taken along line X-X′ of FIG. 34(a). FIG. 34(c) is a sectional view taken along line Y-Y′ of FIG. 34(a).

FIG. 35(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 35(b) is a sectional view taken along line X-X′ of FIG. 35(a). FIG. 35(c) is a sectional view taken along line Y-Y′ of FIG. 35(a).

FIG. 36(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 36(b) is a sectional view taken along line X-X′ of FIG. 36(a). FIG. 36(c) is a sectional view taken along line Y-Y′ of FIG. 36(a).

FIG. 37(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 37(b) is a sectional view taken along line X-X′ of FIG. 37(a). FIG. 37(c) is a sectional view taken along line Y-Y′ of FIG. 37(a).

FIG. 38(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 38(b) is a sectional view taken along line X-X′ of FIG. 38(a). FIG. 38(c) is a sectional view taken along line Y-Y′ of FIG. 38(a).

FIG. 39(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 39(b) is a sectional view taken along line X-X′ of FIG. 39(a). FIG. 39(c) is a sectional view taken along line Y-Y′ of FIG. 39(a).

FIG. 40(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 40(b) is a sectional view taken along line X-X′ of FIG. 40(a). FIG. 40(c) is a sectional view taken along line Y-Y′ of FIG. 40(a).

FIG. 41(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 41(b) is a sectional view taken along line X-X′ of FIG. 41(a). FIG. 41(c) is a sectional view taken along line Y-Y′ of FIG. 41(a).

FIG. 42(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 42(b) is a sectional view taken along line X-X′ of FIG. 42(a). FIG. 42(c) is a sectional view taken along line Y-Y′ of FIG. 42(a).

FIG. 43(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 43(b) is a sectional view taken along line X-X′ of FIG. 43(a). FIG. 43(c) is a sectional view taken along line Y-Y′ of FIG. 43(a).

FIG. 44(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 44(b) is a sectional view taken along line X-X′ of FIG. 44(a). FIG. 44(c) is a sectional view taken along line Y-Y′ of FIG. 44(a).

FIG. 45(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 45(b) is a sectional view taken along line X-X′ of FIG. 45(a). FIG. 45(c) is a sectional view taken along line Y-Y′ of FIG. 45(a).

FIG. 46(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 46(b) is a sectional view taken along line X-X′ of FIG. 46(a). FIG. 46(c) is a sectional view taken along line Y-Y′ of FIG. 46(a).

FIG. 47(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 47(b) is a sectional view taken along line X-X′ of FIG. 47(a). FIG. 47(c) is a sectional view taken along line Y-Y′ of FIG. 47(a).

FIG. 48(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 48(b) is a sectional view taken along line X-X′ of FIG. 48(a). FIG. 48(c) is a sectional view taken along line Y-Y′ of FIG. 48(a).

FIG. 49(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 49(b) is a sectional view taken along line X-X′ of FIG. 49(a). FIG. 49(c) is a sectional view taken along line Y-Y′ of FIG. 49(a).

FIG. 50(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 50(b) is a sectional view taken along line X-X′ of FIG. 50(a). FIG. 50(c) is a sectional view taken along line Y-Y′ of FIG. 50(a).

FIG. 51(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 51(b) is a sectional view taken along line X-X′ of FIG. 51(a). FIG. 51(c) is a sectional view taken along line Y-Y′ of FIG. 51(a).

FIG. 52(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 52(b) is a sectional view taken along line X-X′ of FIG. 52(a). FIG. 52(e) is a sectional view taken along line Y-Y′ of FIG. 52(a).

FIG. 53(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 53(b) is a sectional view taken along line X-X′ of FIG. 53(a). FIG. 53(c) is a sectional view taken along line Y-Y′ of FIG. 53(a).

FIG. 54(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 54(b) is a sectional view taken along line X-X′ of FIG. 54(a). FIG. 54(c) is a sectional view taken along line Y-Y′ of FIG. 54(a).

FIG. 55(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 55(b) is a sectional view taken along line X-X′ of FIG. 55(a). FIG. 55(c) is a sectional view taken along line Y-Y′ of FIG. 55(a).

FIG. 56(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 56(b) is a sectional view taken along line X-X′ of FIG. 56(a). FIG. 56(c) is a sectional view taken along line Y-Y′ of FIG. 56(a).

FIG. 57(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 57(b) is a sectional view taken along line X-X′ of FIG. 57(a). FIG. 57(c) is a sectional view taken along line Y-Y′ of FIG. 57(a).

FIG. 58(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 58(b) is a sectional view taken along line X-X′ of FIG. 58(a). FIG. 58(c) is a sectional view taken along line Y-Y′ of FIG. 58(a).

FIG. 59(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 59(b) is a sectional view taken along line X-X′ of FIG. 59(a). FIG. 59(c) is a sectional view taken along line Y-Y′ of FIG. 59(a).

FIG. 60(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 60(b) is a sectional view taken along line X-X′ of FIG. 60(a). FIG. 60(c) is a sectional view taken along line Y-Y′ of FIG. 60(a).

FIG. 61(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 61(b) is a sectional view taken along line X-X′ of FIG. 61(a). FIG. 61(c) is a sectional view taken along line Y-Y′ of FIG. 61(a).

FIG. 62(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 62(b) is a sectional view taken along line X-X′ of FIG. 62(a). FIG. 62(c) is a sectional view taken along line Y-Y′ of FIG. 62(a).

FIG. 63(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 63(b) is a sectional view taken along line X-X′ of FIG. 63(a). FIG. 63(c) is a sectional view taken along line Y-Y′ of FIG. 63(a).

FIG. 64(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 64(b) is a sectional view taken along line X-X′ of FIG. 64(a). FIG. 64(c) is a sectional view taken along line Y-Y′ of FIG. 64(a).

FIG. 65(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 65(b) is a sectional view taken along line X-X′ of FIG. 65(a). FIG. 65(c) is a sectional view taken along line Y-Y′ of FIG. 65(a).

FIG. 66(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 66(b) is a sectional view taken along line X-X′ of FIG. 66(a). FIG. 66(c) is a sectional view taken along line Y-Y′ of FIG. 66(a).

FIG. 67(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 67(b) is a sectional view taken along line X-X′ of FIG. 67(a). FIG. 67(c) is a sectional view taken along line Y-Y′ of FIG. 67(a).

FIG. 68(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 68(b) is a sectional view taken along line X-X′ of FIG. 68(a). FIG. 68(c) is a sectional view taken along line Y-Y′ of FIG. 68(a).

FIG. 69(a) is a plan view showing a method for producing a semiconductor device according to the present invention. FIG. 69(b) is a sectional view taken along line X-X′ of FIG. 69(a). FIG. 69(c) is a sectional view taken along line Y-Y′ of FIG. 69(a).

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

FIGS. 1(a), 1(b) and 1(c) show a structure of a semiconductor device.

As shown in FIGS. 1(a), 1(b) and 1(c), memory cells serving as semiconductor devices of the present invention are arranged in a first row and a first column, in a first row and a third column, in a second row and a first column, and in a second row and a third column, and contact devices including a contact electrode and a contact line are arranged in a first row and a second column and in a second row and a second column in order to connect source lines to each other.

The memory cell in the second row and the first column includes a fin-shaped semiconductor layer 104 formed on a semiconductor substrate 101; a first insulating film 106 formed around the fin-shaped semiconductor layer 104; a first pillar-shaped semiconductor layer 129 formed on the fin-shaped semiconductor layer 104; a gate insulating film 162 formed around the first pillar-shaped semiconductor layer 129; a gate electrode 168 a made of a metal and formed around the gate insulating film 162; a gate line 168 b made of a metal and connected to the gate electrode 168 a, the gate line 168 b extending in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 104 extends, the gate insulating film 162 being formed around the gate electrode 168 a and the gate line 168 b and on bottom portions of the gate electrode 168 a and the gate line 168 b; a second gate insulating film 173 formed around an upper portion of the first pillar-shaped semiconductor layer 129; a first contact 179 a made of a second metal and formed around the second gate insulating film 173; a second contact 183 a which is made of a third metal and which connects an upper portion of the first contact 179 a to an upper portion of the first pillar-shaped semiconductor layer 129; and a second diffusion layer 143 a formed in a lower portion of the first pillar-shaped semiconductor layer 129, the second diffusion layer 143 a being further formed in the fin-shaped semiconductor layer 104.

The memory cell also includes a pillar-shaped nitride film layer 202 formed on the second contact 183 a, a resistance-changing film 211 formed around an upper portion of the pillar-shaped nitride film layer 202, a lower electrode 206 formed around a lower portion of the pillar-shaped nitride film layer 202 and connected to the resistance-changing film 211, a reset gate insulating film 219 that surrounds the resistance-changing film 211, and a reset gate 220 a that surrounds the reset gate insulating film 219. The pillar-shaped nitride film layer 202 is constituted by a nitride film, and the lower electrode 206 is present between the pillar-shaped nitride film layer 202 and the second contact 183 a.

The resistance-changing film 211 is preferably a phase-change film made of, for example, chalcogenide glass (GST: Ge₂Sb₂Te₅). The lower electrode 206 serving as a heater is preferably made of, for example, titanium nitride.

The reset gate 220 a is made of any material that generates heat through current flow and is preferably made of titanium nitride.

The reset gate insulating film 219 is any highly thermally conductive insulating film and is preferably a nitride film.

The lower electrode 206 is made of any material that generates heat through current flow and is preferably made of titanium nitride.

As a result of current flow through the reset gate 220 a, heat is generated in the reset gate 220 a serving as a heater. This melts the resistance-changing film 211 that is in contact with the heater and thus a state transition can be made to occur.

The memory cell in the second row and the third column includes a fin-shaped semiconductor layer 104 formed on a semiconductor substrate 101; a first insulating film 106 formed around the fin-shaped semiconductor layer 104; a first pillar-shaped semiconductor layer 131 formed on the fin-shaped semiconductor layer 104; a gate insulating film 163 formed around the first pillar-shaped semiconductor layer 131; a gate electrode 170 a made of a metal and formed around the gate insulating film 163; a gate line 170 b made of a metal and connected to the gate electrode 170 a, the gate line 170 b extending in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 104 extends, the gate insulating film 163 being formed around the gate electrode 170 a and the gate line 170 b and on bottom portions of the gate electrode 170 a and the gate line 170 b; a second gate insulating film 174 formed around an upper portion of the first pillar-shaped semiconductor layer 131; a first contact 181 a made of a second metal and formed around the second gate insulating film 174; a second contact 185 a which is made of a third metal and which connects an upper portion of the first contact 181 a to an upper portion of the first pillar-shaped semiconductor layer 131; and a second diffusion layer 143 a formed in a lower portion of the first pillar-shaped semiconductor layer 131, the second diffusion layer 143 a being further formed in the fin-shaped semiconductor layer 104.

The memory cell also includes a pillar-shaped insulating layer 203 formed on the second contact 185 a, a resistance-changing film 212 formed around an upper portion of the pillar-shaped insulating layer 203, a lower electrode 207 formed around a lower portion of the pillar-shaped insulating layer 203 and connected to the resistance-changing film 212, a reset gate insulating film 219 that surrounds the resistance-changing film 212, and a reset gate 220 b that surrounds the reset gate insulating film 219. The pillar-shaped insulating layer 203 is constituted by a nitride film, and the lower electrode 207 is present between the pillar-shaped insulating layer 203 and the second contact 185 a.

The resistance-changing film 211 and the resistance-changing film 212 are connected to each other through a bit line 225 a.

The memory cell in the first row and the first column includes a fin-shaped semiconductor layer 105 formed on a semiconductor substrate 101; a first insulating film 106 formed around the fin-shaped semiconductor layer 105; a first pillar-shaped semiconductor layer 132 formed on the fin-shaped semiconductor layer 105; a gate insulating film 162 formed around the first pillar-shaped semiconductor layer 132; a gate electrode 168 a made of a metal and formed around the gate insulating film 162; a gate line 168 b made of a metal and connected to the gate electrode 168 a, the gate line 168 b extending in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 105 extends, the gate insulating film 162 being formed around the gate electrode 168 a and the gate line 168 b and on bottom portions of the gate electrode 168 a and the gate line 168 b; a second gate insulating film 173 formed around an upper portion of the first pillar-shaped semiconductor layer 132; a first contact 179 b made of a second metal and formed around the second gate insulating film 173; a second contact 183 b which is made of a third metal and which connects an upper portion of the first contact 179 b to an upper portion of the first pillar-shaped semiconductor layer 132; and a second diffusion layer 143 b formed in a lower portion of the first pillar-shaped semiconductor layer 132, the second diffusion layer 143 b being further formed in the fin-shaped semiconductor layer 105.

The memory cell also includes a pillar-shaped insulating layer 204 formed on the second contact 183 b, a resistance-changing film 213 formed around an upper portion of the pillar-shaped insulating layer 204, a lower electrode 208 formed around a lower portion of the pillar-shaped insulating layer 204 and connected to the resistance-changing film 213, a reset gate insulating film 219 that surrounds the resistance-changing film 213, and a reset gate 220 a that surrounds the reset gate insulating film 219. The pillar-shaped insulating layer 204 is constituted by a nitride film, and the lower electrode 208 is present between the pillar-shaped insulating layer 204 and the second contact 183 b.

The memory cell in the first row and the third column includes a fin-shaped semiconductor layer 105 formed on a semiconductor substrate 101; a first insulating film 106 formed around the fin-shaped semiconductor layer 105; a first pillar-shaped semiconductor layer 134 formed on the fin-shaped semiconductor layer 105; a gate insulating film 163 formed around the first pillar-shaped semiconductor layer 134; a gate electrode 170 a made of a metal and formed around the gate insulating film 163; a gate line 170 b made of a metal and connected to the gate electrode 170 a, the gate line 170 b extending in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 105 extends, the gate insulating film 163 being formed around the gate electrode 170 a and the gate line 170 b and on bottom portions of the gate electrode 170 a and the gate line 170 b; a second gate insulating film 174 formed around an upper portion of the first pillar-shaped semiconductor layer 134; a first contact 181 b made of a second metal and formed around the second gate insulating film 174; a second contact 185 b which is made of a third metal and which connects an upper portion of the first contact 181 b to an upper portion of the first pillar-shaped semiconductor layer 134; and a second diffusion layer 143 b formed in a lower portion of the first pillar-shaped semiconductor layer 134, the second diffusion layer 143 b being further formed in the fin-shaped semiconductor layer 105.

The memory cell also includes a pillar-shaped insulating layer 205 formed on the second contact 185 b, a resistance-changing film 214 formed around an upper portion of the pillar-shaped insulating layer 205, a lower electrode 209 formed around a lower portion of the pillar-shaped insulating layer 205 and connected to the resistance-changing film 214, a reset gate insulating film 219 that surrounds the resistance-changing film 214, and a reset gate 220 b that surrounds the reset gate insulating film 219. The pillar-shaped insulating layer 205 is constituted by a nitride film, and the lower electrode 209 is present between the pillar-shaped insulating layer 205 and the second contact 185 b.

The resistance-changing film 213 and the resistance-changing film 214 are connected to each other through a bit line 225 b.

The pillar-shaped nitride film layers 202, 203, 204, and 205, the resistance-changing films 211, 212, 213, and 214 formed around the upper portions of the pillar-shaped nitride film layers 202, 203, 204, and 205, and the lower electrodes 206, 207, 208, and 209 formed around the lower portions of the pillar-shaped nitride film layers 202, 203, 204, and 205 and connected to the resistance-changing films 211, 212, 213, and 214 are included. This can decrease the cross-sectional areas of phase-change films, which are the resistance-changing films 211, 212, 213, and 214, and heater elements, which are the lower electrodes 206, 207, 208, and 209, in a current-flowing direction.

The pillar-shaped nitride film layers 202, 203, 204, and 205 are each constituted by a nitride film, and thus the cooling of the phase-change films can be accelerated. The lower electrodes 206, 207, 208, and 209 are present below the pillar-shaped nitride film layers 202, 203, 204, and 205, and thus the contact resistance between the lower electrodes 206, 207, 208, and 209 and selection transistors can be reduced.

The gate electrodes 168 a and 170 a are made of a metal and the gate lines 168 b and 170 b are made of a metal. Furthermore, there are the first contacts 179 a, 179 b, 181 a, and 181 b made of a second metal and formed around the second gate insulating films 173 and 174 and the second contacts 183 a, 183 b, 185 a, and 185 b which are made of a third metal and which connect the upper portions of the first contacts 179 a, 179 b, 181 a, and 181 b to the upper portions of the pillar-shaped semiconductor layers 129, 131, 132, and 134. Since a large amount of metal is used, the cooling can be accelerated. In addition, since the gate insulating films 162 and 163 are formed around the gate electrodes 168 a and 170 a and the gate lines 168 b and 170 b and on bottom portions of the gate electrodes 168 a and 170 a and the gate lines 168 b and 170 b, a metal gate is formed through a gate-last process. Therefore, both a metal gate process and a high-temperature process can be performed.

Furthermore, the gate insulating films 162 and 163 are formed around the gate electrodes 168 a and 170 a and the gate lines 168 b and 170 b and on bottom portions of the gate electrodes 168 a and 170 a and the gate lines 168 b and 170 b. The gate electrodes 168 a and 170 a are made of a metal. The gate lines 168 b and 170 b are made of a metal. The gate lines 168 b and 170 b extend in a direction perpendicular to a direction in which the fin-shaped semiconductor layers 104 and 105 extend. The second diffusion layers 143 a and 143 b are further formed in the fin-shaped semiconductor layers 104 and 105. The outer width of the gate electrodes 168 a and 170 a is equal to the width of the gate lines 168 b and 170 b. The width of the first pillar-shaped semiconductor layers 129, 131, 132, and 134 is equal to the width of the fin-shaped semiconductor layers 104 and 105. Thus, the fin-shaped semiconductor layers 104 and 105, the first pillar-shaped semiconductor layers 129, 131, 132, and 134, the gate electrodes 168 a and 170 a, and the gate lines 168 b and 170 b of the semiconductor device are formed through a self-aligned process with two masks. This can reduce the number of steps.

The contact device in the second row and the second column includes the fin-shaped semiconductor layer 104 formed on the semiconductor substrate 101; the first insulating film 106 formed around the fin-shaped semiconductor layer 104; a second pillar-shaped semiconductor layer 130 formed on the fin-shaped semiconductor layer 104, the width of the second pillar-shaped semiconductor layer 130 in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 104 extends being equal to the width of the fin-shaped semiconductor layer 104 in a direction perpendicular to the direction in which the fin-shaped semiconductor layer 104 extends; a contact electrode 169 a made of a metal and formed around the second pillar-shaped semiconductor layer 130; the gate insulating film 165 formed between the second pillar-shaped semiconductor layer 130 and the contact electrode 169 a; the contact line 169 b which is made of a metal and which extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 104 connected to the contact electrode 169 a extends; the gate insulating film 164 formed around the contact electrode 169 a and the contact line 169 b, the outer width of the contact electrode 169 a being equal to the width of the contact line 169 b; and the second diffusion layer 143 a formed in the fin-shaped semiconductor layer 104 and in a lower portion of the second pillar-shaped semiconductor layer 130, the contact electrode 169 a being connected to the second diffusion layer 143 a.

The contact device also includes a second gate insulating film 175 formed around an upper portion of the second pillar-shaped semiconductor layer 130; a third contact 180 a made of a second metal and formed around the second gate insulating film 175, the third contact 180 a being connected to the contact electrode 169 a; and a fourth contact 184 a which is made of a third metal and which connects the upper portion of the third contact 180 a to an upper portion of the second pillar-shaped semiconductor layer 130.

Therefore, the second diffusion layer 143 a, the contact electrode 169 a, the contact line 169 b, the third contact 180 a, and the fourth contact 184 a are connected to each other.

The contact device in the first row and the second column includes the fin-shaped semiconductor layer 105 formed on the semiconductor substrate 101; the first insulating film 106 formed around the fin-shaped semiconductor layer 105; a second pillar-shaped semiconductor layer 133 formed on the fin-shaped semiconductor layer 105, the width of the second pillar-shaped semiconductor layer 133 in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 105 extends being equal to the width of the fin-shaped semiconductor layer 105 in a direction perpendicular to the direction in which the fin-shaped semiconductor layer 105 extends; a contact electrode 169 a made of a metal and formed around the second pillar-shaped semiconductor layer 133; the gate insulating film 166 formed between the second pillar-shaped semiconductor layer 133 and the contact electrode 169 a; the contact line 169 b which is made of a metal and which extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer 105 connected to the contact electrode 169 a extends; the gate insulating film 164 formed around the contact electrode 169 a and the contact line 169 b, the outer width of the contact electrode 169 a being equal to the width of the contact line 169 b; and the second diffusion layer 143 b formed in the fin-shaped semiconductor layer 105 and in a lower portion of the second pillar-shaped semiconductor layer 133, the contact electrode 169 a being connected to the second diffusion layer 143 b.

The contact device also includes a second gate insulating film 176 formed around an upper portion of the second pillar-shaped semiconductor layer 133; a third contact 180 b made of a second metal and formed around the second gate insulating film 176, the third contact 180 b being connected to the contact electrode 169 a; and a fourth contact 184 b which is made of a third metal and which connects the upper portion of the third contact 180 b to an upper portion of the second pillar-shaped semiconductor layer 133.

Therefore, the second diffusion layer 143 b, the contact electrode 169 a, the contact line 169 b, the third contact 180 b, and the fourth contact 184 b are connected to each other.

As a result of the presence of the contact line 169 b which is parallel to the gate lines 168 b and 170 b and is connected to the second diffusion layers 143 a and 143 b, the second diffusion layers 143 a and 143 b are connected to each other. This can decrease the resistance of a source line and can suppress an increase in the source voltage caused by electric current at the time of the set operation. Regarding the contact line 169 b which is parallel to the gate lines 168 b and 170 b, for example, one contact line 169 b is preferably disposed for every 2 memory cells, 4 memory cells, 8 memory cells, 16 memory cells, 32 memory cells, or 64 memory cells arranged in a row in a direction in which the bit lines 225 a and 225 b extend.

A structure constituted by the second pillar-shaped semiconductor layers 130 and 133, the contact electrode 169 a formed around the second pillar-shaped semiconductor layers 130 and 133, and the contact line 169 b is the same as a transistor structure, except that the contact electrode 169 a is connected to the second diffusion layers 143 a and 143 b. All source lines which are constituted by the second diffusion layers 143 a and 143 b and which extend in a direction parallel to a direction in which the gate lines 168 b and 170 b extend are connected to the contact line 169 b. This can reduce the number of steps.

FIGS. 2(a), 2(b) and 2(c) shows a structure in which a second diffusion layer 143 c is formed to a deep portion of the semiconductor substrate 101 so that the second diffusion layers 143 a and 143 b in FIG. 1 are connected to each other. In this structure, the source resistance can be further decreased.

FIGS. 3(a), 3(b) and 3(c) shows a structure in which the fin-shaped semiconductor layer 105 in FIGS. 2(a), 2(b) and 2(c) and the first insulating film 106 formed around the fin-shaped semiconductor layer 105 in FIGS. 2(a), 2(b) and 2(c) are omitted and a second diffusion layer 143 d is formed on the semiconductor substrate 101. In this structure, the source resistance can be further decreased.

A production process for forming a structure of a semiconductor device according to an embodiment of the present invention will be described below with reference to FIGS. 4(a) to 69(c).

First, a first step will be described, the first step including forming a fin-shaped semiconductor layer on a semiconductor substrate and forming a first insulating film around the fin-shaped semiconductor layer. In this embodiment, a silicon substrate is employed, but any semiconductor substrate may be employed.

As shown in FIGS. 4(a), 4(b) and 4(c), first resists 102 and 103 for forming fin-shaped silicon layers are formed on a silicon substrate 101.

As shown in FIGS. 5(a), 5(b) and 5(c), the silicon substrate 101 is etched to form fin-shaped silicon layers 104 and 105. This time, the fin-shaped silicon layers are formed using a resist as a mask, but a hard mask such as an oxide film or a nitride film may be used.

As shown in FIGS. 6(a), 6(b) and 6(c), the first resists 102 and 103 are removed.

As shown in FIGS. 7(a), 7(b) and 7(c), a first insulating film 106 is deposited around the fin-shaped silicon layers 104 and 105. An oxide film formed by high-density plasma or an oxide film formed by low-pressure CVD (chemical vapor deposition) may be used as the first insulating film.

As shown in FIGS. 8(a), 8(b) and 8(c), the first insulating film 106 is etched back to expose upper portions of the fin-shaped silicon layers 104 and 105.

The first step has been described, the first step including forming a fin-shaped semiconductor layer on a semiconductor substrate and forming a first insulating film around the fin-shaped semiconductor layer.

Next, a second step will be described, the second step including, after the first step, forming a second insulating film around the fin-shaped semiconductor layer, depositing a first polysilicon on the second insulating film and planarizing the first polysilicon, forming a second resist for forming a first gate line, a first pillar-shaped semiconductor layer, a first contact line, and a second pillar-shaped semiconductor layer so that the second resist extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends, and etching the first polysilicon, the second insulating film, and the fin-shaped semiconductor layer to form a first pillar-shaped semiconductor layer, a first dummy gate constituted by the first polysilicon, a second pillar-shaped semiconductor layer, and a second dummy gate constituted by the first polysilicon.

As shown in FIGS. 9(a), 9(b) and (c), second insulating films 107 and 108 are formed around the fin-shaped silicon layers 104 and 105. The second insulating films 107 and 108 are preferably oxide films.

As shown in FIGS. 10(a), 10(b) and 10(c), a first polysilicon 109 is deposited on the second insulating films 107 and 108 and planarized.

As shown in FIGS. 11(a), 11(b) and 11(c), a third insulating film 110 is formed on the first polysilicon 109. The third insulating film 110 is preferably a nitride film.

As shown in FIGS. 12(a), 12(b) and 12(c), second resists 111, 112, and 113 for forming gate lines 168 b and 170 b, first pillar-shaped silicon layers 129, 131, 132, and 134, second pillar-shaped silicon layers 130 and 133, and a contact line 169 b are formed so as to extend in a direction perpendicular to the direction in which the fin-shaped silicon layers 104 and 105 extend.

As shown in FIGS. 13(a), 13(b) and 13(c), the third insulating film 110, the first polysilicon 109, the second insulating films 107 and 108, and the fin-shaped silicon layers 104 and 105 are etched to form first pillar-shaped silicon layers 129, 131, 132, and 134, first dummy gates 117 and 119 constituted by the first polysilicon, second pillar-shaped silicon layers 130 and 133, and a second dummy gate 118 constituted by the first polysilicon. Herein, the third insulating film 110 is separated into third insulating films 114, 115, and 116. The second insulating films 107 and 108 are separated into second insulating films 123, 124, 125, 126, 127, and 128. If the second resists 111, 112, and 113 are removed during the etching, the third insulating films 114, 115, and 116 function as hard masks. If the second resists are not removed during the etching, the third insulating film is not necessarily used.

As shown in FIGS. 14(a), 14(b) and 14(c), the third insulating film 114, 115, and 116 are removed.

The second step has been described, the second step including, after the first step, forming a second insulating film around the fin-shaped semiconductor layer, depositing a first polysilicon on the second insulating film and planarizing the first polysilicon, forming a second resist for forming a first gate line, a first pillar-shaped semiconductor layer, a first contact line, and a second pillar-shaped semiconductor layer so that the second resist extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends, and etching the first polysilicon, the second insulating film, and the fin-shaped semiconductor layer to form a first pillar-shaped semiconductor layer, a first dummy gate constituted by the first polysilicon, a second pillar-shaped semiconductor layer, and a second dummy gate constituted by the first polysilicon.

Next, a third step will be described, the third step including, after the second step, forming a fourth insulating film around the first pillar-shaped semiconductor layer, the second pillar-shaped semiconductor layer, the first dummy gate, and the second dummy gate, depositing a second polysilicon around the fourth insulating film, and forming a third dummy gate and a fourth dummy gate by etching the second polysilicon so that the second polysilicon is left on side walls of the first dummy gate, the first pillar-shaped semiconductor layer, the second dummy gate, and the second pillar-shaped semiconductor layer.

As shown in FIGS. 15(a), 15(b) and 15(c), a fourth insulating film 135 is formed around the first pillar-shaped silicon layers 129, 131, 132, and 134, the second pillar-shaped silicon layers 130 and 133, the first dummy gates 117 and 119, and the second dummy gate 118. A second polysilicon 136 is deposited around the fourth insulating film 135.

As shown in FIGS. 16(a), 16(b) and 16(c), third dummy gates 137 and 139 and a fourth dummy gate 138 are formed by etching the second polysilicon 136 so that the second polysilicon 136 is left on side walls of the first dummy gates 117 and 119, the first pillar-shaped silicon layers 129, 131, 132, and 134, the second dummy gate 118, and the second pillar-shaped silicon layers 130 and 133. Herein, the fourth insulating film 135 may be separated into fourth insulating films 140, 141, and 142.

The third step has been described, the third step including, after the second step, forming a fourth insulating film around the first pillar-shaped semiconductor layer, the second pillar-shaped semiconductor layer, the first dummy gate, and the second dummy gate, depositing a second polysilicon around the fourth insulating film, and forming a third dummy gate and a fourth dummy gate by etching the second polysilicon so that the second polysilicon is left on side walls of the first dummy gate, the first pillar-shaped semiconductor layer, the second dummy gate, and the second pillar-shaped semiconductor layer.

Next, a fourth step will be described, the fourth step including forming a second diffusion layer in an upper portion of the fin-shaped semiconductor layer and lower portions of the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer, forming a fifth insulating film around the third dummy gate and the fourth dummy gate, etching the fifth insulating film to make the fifth insulating film remain as a side wall, and forming a metal and semiconductor compound in an upper portion of the second diffusion layer.

As shown in FIGS. 17(a), 17(b) and 17(c), an impurity is introduced to form second diffusion layers 143 a and 143 b in lower portions of the first pillar-shaped silicon layers 129, 131, 132, and 134 and the second pillar-shaped silicon layers 130 and 133. When n-type diffusion layers are formed, arsenic or phosphorus is preferably introduced. When p-type diffusion layers are formed, boron is preferably introduced. The formation of the diffusion layers may be performed after the formation of a side wall constituted by a fifth insulating film described below.

As shown in FIGS. 18(a), 18(b) and 18(c), a fifth insulating film 144 is formed around the third dummy gates 137 and 139 and the fourth dummy gate 138. The fifth insulating film 144 is preferably a nitride film.

As shown in FIGS. 19(a), 19(b) and 19(c), the fifth insulating film 144 is etched to make the fifth insulating film 144 remain as a side wall. Thus, side walls 145, 146, and 147 constituted by the fifth insulating film are formed.

As shown in FIGS. 20(a), 20(b) and 20(c), metal and semiconductor compounds 148, 149, 150, 151, 152, 153, 154, and 155 are formed in upper portions of the second diffusion layers 143 a and 143 b. Herein, metal and semiconductor compounds 156, 158, and 157 are also formed in upper portions of the third dummy gates 137 and 139 and an upper portion of the fourth dummy gate 138.

The fourth step has been described, the fourth step including forming a second diffusion layer in an upper portion of the fin-shaped semiconductor layer and lower portions of the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer, forming a fifth insulating film around the third dummy gate and the fourth dummy gate, etching the fifth insulating film to make the fifth insulating film remain as a side wall, and forming a metal and semiconductor compound in an upper portion of the second diffusion layer.

A fifth step will be described, the fifth step including, after the fourth step, depositing an interlayer insulating film, performing chemical mechanical polishing to expose upper portions of the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the second insulating film and the fourth insulating film, forming a gate insulating film around the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer and on an inner side of the fifth insulating film, forming a third resist for removing a portion of the gate insulating film located in a periphery of a bottom portion of the second pillar-shaped semiconductor layer, removing the portion of the gate insulating film located in the periphery of the bottom portion of the second pillar-shaped semiconductor layer, and depositing a first metal and etching back the first metal to expose an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, to form a gate electrode and a gate line around the first pillar-shaped semiconductor layer, and to form a contact electrode and a contact line around the second pillar-shaped semiconductor layer.

As shown in FIGS. 21(a), 21(b) and 21(c), an interlayer insulating film 159 is deposited. A contact stopper film may be used.

As shown in FIGS. 22(a), 22(b) and 22(c), chemical mechanical polishing is performed to expose upper portions of the first dummy gates 117 and 119, the second dummy gate 118, the third dummy gates 137 and 139, and the fourth dummy gate 138. Herein, the metal and semiconductor compounds 156, 158, and 157 located in the upper portions of the third dummy gates 137 and 139 and the fourth dummy gate 138 are removed.

As shown in FIGS. 23(a), 23(b) and 23(c), the first dummy gates 117 and 119, the second dummy gate 118, the third dummy gates 137 and 139, and the fourth dummy gate 138 are removed.

As shown in FIGS. 24(a), 24(b) and 24(c), the second insulating films 123, 124, 125, 126, 127, and 128 and the fourth insulating films 140, 141, and 142 are removed.

As shown in FIGS. 25(a), 25(b) and 25(c), a gate insulating film 160 is formed around the first pillar-shaped silicon layers 129, 131, 132, and 134 and the second pillar-shaped silicon layers 130 and 133 and on the inner sides of the side walls 145, 146, and 147.

As shown in FIGS. 26(a), 26(b) and 26(c), a third resist 161 for removing portions of the gate insulating film 160 located in peripheries of the bottom portions of the second pillar-shaped silicon layers 130 and 133 is formed.

As shown in FIGS. 27(a), 27(b) and 27(c), the portions of the gate insulating film 160 located in the peripheries of the bottom portions of the second pillar-shaped silicon layers 130 and 133 are removed. The gate insulating film is separated into gate insulating films 162, 163, 164, 165, and 166. Furthermore, the gate insulating films 164, 165, and 166 may be removed by isotropic etching.

As shown in FIGS. 28(a), 28(b) and 28(c), the third resist 161 is removed.

As shown in FIGS. 29(a), 29(b) and 29(c), a metal 167 is deposited.

As shown in FIGS. 30(a), 30(b) and 30(c), the metal 167 is etched back to form gate electrodes 168 a and 170 a and gate lines 168 b and 170 b around the first pillar-shaped silicon layers 129, 131, 132, and 134 and to form a contact electrode 169 a and a contact line 169 b around the second pillar-shaped silicon layers 130 and 133.

The fifth step has been described, the fifth step including, after the fourth step, depositing an interlayer insulating film, performing chemical mechanical polishing to expose upper portions of the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the first dummy gate, the second dummy gate, the third dummy gate, and the fourth dummy gate, removing the second insulating film and the fourth insulating film, forming a gate insulating film around the first pillar-shaped semiconductor layer and the second pillar-shaped semiconductor layer and on an inner side of the fifth insulating film, forming a third resist for removing a portion of the gate insulating film located in a periphery of a bottom portion of the second pillar-shaped semiconductor layer, removing the portion of the gate insulating film located in the periphery of the bottom portion of the second pillar-shaped semiconductor layer, and depositing a first metal and etching back the first metal to expose an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, to form a gate electrode and a gate line around the first pillar-shaped semiconductor layer, and to form a contact electrode and a contact line around the second pillar-shaped semiconductor layer.

Next, a sixth step will be described, the sixth step including, after the fifth step, depositing a second gate insulating film around the first pillar-shaped semiconductor layer, on the gate electrode and the gate line, around the second pillar-shaped semiconductor layer, and on the contact electrode and the contact line, depositing a second metal, exposing an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, removing a portion of the second gate insulating film on the first pillar-shaped semiconductor layer, depositing a third metal, and etching portions of the third metal and the second metal to form a first contact in which the second metal surrounds an upper side wall of the first pillar-shaped semiconductor layer and to form a second contact which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer.

As shown in FIGS. 31(a), 31(b) and 31(c), the exposed gate insulating films 162, 163, 164, 165, and 166 are removed.

As shown in FIGS. 32(a), 32(b) and 32(c), a second gate insulating film 171 is deposited around the first pillar-shaped silicon layers 129, 131, 132, and 134, on the gate electrodes 168 a and 170 a and the gate lines 168 b and 170 b, around the second pillar-shaped silicon layers 130 and 133, and on the contact electrode 169 a and the contact line 169 b.

As shown in FIGS. 33(a), 33(b) and 33(c), a fourth resist 172 for removing at least a portion of the second gate insulating film 171 on the contact electrode 169 a and the contact line 169 b is formed.

As shown in FIGS. 34(a), 34(b) and 34(c), at least a portion of the second gate insulating film 171 on the contact electrode 169 a and the contact line 169 b is removed. The second gate insulating film 171 is separated into second gate insulating films 173, 174, 175, 176, and 177. The second gate insulating films 175, 176, and 177 may be removed by isotropic etching.

To form contacts, etching may be performed by a thickness of the first gate insulating film and by a thickness of the second gate insulating film, which does not require a step of forming a deep contact hole.

As shown in FIGS. 35(a), 35(b) and 35(c), the fourth resist 172 is removed.

As shown in FIGS. 36(a), 36(b) and 36(c), a second metal 178 is deposited. In the case of n-type transistors, the second metal 178 preferably has a work function of 4.0 eV to 4.2 eV. In the case of p-type transistors, the second metal 178 preferably has a work function of 5.0 eV to 5.2 eV.

As shown in FIGS. 37(a), 37(b) and 37(c), the second metal 178 is etched back to expose the upper portions of the first pillar-shaped silicon layers 129, 131, 132, and 134 and the upper portions of the second pillar-shaped silicon layers 130 and 133. Herein, the second metal 178 is changed into second metal lines 179, 180, and 181.

As shown in FIGS. 38(a), 38(b) and 38(c), portions of the second gate insulating films 173 and 174 on the exposed first pillar-shaped silicon layers 129, 131, 132, and 134 are removed.

As shown in FIGS. 39(a), 39(b) and 39(c), a third metal 182 is deposited. The third metal 182 may be the same metal as the second metal 178.

As shown in FIGS. 40(a), 40(b) and 40(c), the third metal 182 is etched back to form third metal lines 183, 184, and 185.

As shown in FIGS. 41(a), 41(b) and 41(c), fifth resists 186 and 187 which extend so as to be perpendicular to the second metal lines 179, 180, and 181 and the third metal lines 183, 184, and 185 are formed.

As shown in FIGS. 42(a), 42(b) and 42(c), the second metal lines 179, 180, and 181 and the third metal lines 183, 184, and 185 are etched to form first contacts 179 a, 179 b, 181 a, and 181 b, second contacts 183 a, 183 b, 185 a, and 185 b, third contacts 180 a and 180 b, and fourth contacts 184 a and 184 b.

As shown in FIGS. 43(a), 43(b) and 43(c), the fifth resists 186 and 187 are removed.

The sixth step has been described, the sixth step including, after the fifth step, depositing a second gate insulating film around the first pillar-shaped semiconductor layer, on the gate electrode and the gate line, around the second pillar-shaped semiconductor layer, and on the contact electrode and the contact line, depositing a second metal, exposing an upper portion of the first pillar-shaped semiconductor layer and an upper portion of the second pillar-shaped semiconductor layer, removing a portion of the second gate insulating film on the first pillar-shaped semiconductor layer, depositing a third metal, and etching portions of the third metal and the second metal to form a first contact in which the second metal surrounds an upper side wall of the first pillar-shaped semiconductor layer and to form a second contact which connects an upper portion of the first contact to an upper portion of the first pillar-shaped semiconductor layer.

Next, a seventh step will be described, the seventh step including, after the sixth step, depositing a second interlayer insulating film, forming a contact hole, depositing a fourth metal and a nitride film, removing portions of the fourth metal and the nitride film on the second interlayer insulating film to form a pillar-shaped nitride film layer and a lower electrode in the contact hole, the lower electrode surrounding a bottom portion of the pillar-shaped nitride film layer and the pillar-shaped nitride film layer, etching back the second interlayer insulating film to expose an upper portion of the lower electrode that surrounds the pillar-shaped nitride film layer, removing the exposed upper portion of the lower electrode that surrounds the pillar-shaped nitride film, depositing a resistance-changing film so that the resistance-changing film surrounds the pillar-shaped nitride film layer and is connected to the lower electrode, etching the resistance-changing film to make the resistance-changing film remain as a side wall on an upper portion of the pillar-shaped nitride film layer, forming a reset gate insulating film so that the reset gate insulating film surrounds the resistance-changing film, and forming a reset gate.

As shown in FIGS. 44(a), 44(b) and 44(c), a second interlayer insulating film 194 is deposited.

As shown in FIGS. 45(a), 45(b) and 45(c), a sixth resist 195 for forming contact holes is formed.

As shown in FIGS. 46(a), 46(b) and 46(c), contact holes 196, 197, 198, and 199 are formed.

As shown in FIGS. 47(a), 47(b) and 47(c), the sixth resist 195 is removed.

As shown in FIGS. 48(a), 48(b) and 48(c), a fourth metal 200 is deposited. The fourth metal 200 is preferably titanium nitride.

As shown in FIGS. 49(a), 49(b) and 49(c), a nitride film 201 is deposited.

As shown in FIGS. 50(a), 50(b) and 50(c), the nitride film 201 is etched back to remove a portion of the nitride film 201 on the second interlayer insulating film 194. Herein, pillar-shaped nitride film layers 202, 203, 204, and 205 are formed.

As shown in FIGS. 51(a), 51(b) and 51(c), a portion of the fourth metal 200 on the second interlayer insulating film 194 is removed to form lower electrodes 206, 207, 208, and 209 that surround bottom portions of the pillar-shaped nitride film layers 202, 203, 204, and 205 and the pillar-shaped nitride film layers 202, 203, 204, and 205.

As shown in FIGS. 52(a), 52(b) and 52(c), the second interlayer insulating film 194 is etched back to expose upper portions of the lower electrodes 206, 207, 208, and 209 that surround the pillar-shaped nitride film layers 202, 203, 204, and 205.

As shown in FIGS. 53(a), 53(b) and 53(c), the exposed upper portions of the lower electrodes 206, 207, 208, and 209 that surround the pillar-shaped nitride film layers 202, 203, 204, and 205 are removed.

As shown in FIGS. 54(a), 54(b) and 54(c), the second interlayer insulating film 194 is etched back to expose upper portions of the lower electrodes 206, 207, 208, and 209 that surround the pillar-shaped nitride film layers 202, 203, 204, and 205. If upper portions of the lower electrodes 206, 207, 208, and 209 are exposed after the step shown in FIGS. 53(a), 53(b) and 53(c), this step is omitted.

As shown in FIGS. 55(a), 55(b) and 55(c), a resistance-changing film 210 is deposited so as to surround the pillar-shaped nitride film layers 202, 203, 204, and 205 and to be connected to the lower electrodes 206, 207, 208, and 209. The resistance-changing film 210 is preferably a phase-change film composed of chalcogenide glass (GST: Ge₂Sb₂Te₅).

As shown in FIGS. 56(a), 56(b) and 56(c), the resistance-changing film 210 is etched to make the resistance-changing film 210 remain as side walls on upper portions of the pillar-shaped nitride film layers 202, 203, 204, and 205. The resistance-changing film 210 is separated into resistance-changing films 211, 212, 213, and 214. The resistance-changing film 210 may also be left as resistance-changing films 215, 216, 217, and 218 on upper side walls of the lower electrodes 206, 207, 208, and 209.

As shown in FIGS. 57(a), 57(b) and 57(c), a reset gate insulating film 219 is deposited and a metal 220 to serve as a reset gate is deposited. The reset gate insulating film 219 is preferably a nitride film. The metal 220 is preferably titanium nitride.

As shown in FIGS. 58(a), 58(b) and 58(c), the metal 220 is etched back.

As shown in FIG. 59, a nitride film 221 is deposited.

As shown in FIGS. 60(a), 60(b) and 60(c), seventh resists 222 and 223 for forming reset gates are formed.

As shown in FIGS. 61(a), 61(b) and 61(c), the nitride film 221 is etched. The nitride film 221 is separated into nitride films 221 a and 221 b.

As shown in FIGS. 62(a), 62(b) and 62(c), the metal 220 is etched using the seventh resists 222 and 223 and the nitride films 221 a and 221 b as masks to form reset gates 220 a and 220 b.

As shown in FIGS. 63(a), 63(b) and 63(c), seventh resists 222 and 223 are removed.

As shown in FIGS. 64(a), 64(b) and 64(c), a third interlayer insulating film 224 is deposited.

As shown in FIGS. 65(a), 65(b) and 65(c), the third interlayer insulating film 224 is planarized to expose upper portions of the resistance-changing films 211, 212, 213, and 214.

As shown in FIGS. 66(a), 66(b) and 66(c), a metal 225 is deposited.

As shown in FIGS. 67(a), 67(b) and 67(c), eighth resists 226 and 227 for forming bit lines are formed.

As shown in FIGS. 68(a), 68(b) and 68(c), the metal 225 is etched to form bit lines 225 a and 225 b.

As shown in FIGS. 69(a), 69(b) and 69(c), the eighth resists 226 and 227 are removed.

The seventh step has been described, the seventh step including, after the sixth step, depositing a second interlayer insulating film, forming a contact hole, depositing a fourth metal and a nitride film, removing portions of the fourth metal and the nitride film on the second interlayer insulating film to form a pillar-shaped nitride film layer and a lower electrode in the contact hole, the lower electrode surrounding a bottom portion of the pillar-shaped nitride film layer and the pillar-shaped nitride film layer, etching back the second interlayer insulating film to expose an upper portion of the lower electrode that surrounds the pillar-shaped nitride film layer, removing the exposed upper portion of the lower electrode that surrounds the pillar-shaped nitride film, depositing a resistance-changing film so that the resistance-changing film surrounds the pillar-shaped nitride film layer and is connected to the lower electrode, etching the resistance-changing film to make the resistance-changing film remain as a side wall on an upper portion of the pillar-shaped nitride film layer, forming a reset gate insulating film so that the reset gate insulating film surrounds the resistance-changing film, and forming a reset gate.

The production process for forming a structure of a semiconductor device according to an embodiment of the present invention has been described.

In the present invention, various embodiments and modifications can be made without departing from the broad sprit and scope of the present invention. Furthermore, the above-described embodiment is provided to describe one embodiment of the present invention, and the scope of the present invention is not limited thereto.

For example, a method for producing a semiconductor device in which the p-type (including the p⁺-type) and the n-type (including the n⁺-type) are each changed to the opposite conductivity type in the above embodiment, and a semiconductor device produced by the method are also obviously included in the technical scope of the present invention. 

What is claimed is:
 1. A semiconductor device comprising: a first pillar-shaped semiconductor layer; a first gate insulating film around the first pillar-shaped semiconductor layer; a gate electrode made of a metal and around the first gate insulating film; a gate line made of a metal and connected to the gate electrode; a second gate insulating film around an upper portion of the first pillar-shaped semiconductor layer; a first contact made of a second metal and around the second gate insulating film, wherein an upper portion of the first contact is electrically connected to an upper portion of the first pillar-shaped semiconductor layer; a second diffusion layer in a lower portion of the first pillar-shaped semiconductor layer; a pillar-shaped insulating layer above the first pillar-shaped semiconductor layer; a resistance-changing film around an upper portion of the pillar-shaped insulating layer; a lower electrode around a lower portion of the pillar-shaped insulating layer and connected to the resistance-changing film and electrically connected to the upper portion of the first pillar shaped semiconductor layer; a reset gate insulating film that surrounds the resistance-changing film; and a reset gate that surrounds the reset gate insulating film.
 2. The semiconductor device according to claim 1, wherein the pillar-shaped insulating layer is constituted by a nitride film, and the lower electrode is between the pillar-shaped insulating layer and the upper portion of the first pillar-shaped semiconductor layer.
 3. The semiconductor device according to claim 1, wherein the reset gate is made of titanium nitride.
 4. The semiconductor device according to claim 1, wherein the reset gate insulating film is a nitride film.
 5. The semiconductor device according to claim 2, wherein the lower electrode is made of titanium nitride.
 6. The semiconductor device according to claim 1, wherein the resistance-changing film is reset by causing an electric current to flow through the reset gate.
 7. The semiconductor device according to claim 1, wherein the second metal of the first contact has a work function of 4.0 eV to 4.2 eV.
 8. The semiconductor device according to claim 1, wherein the second metal of the first contact has a work function of 5.0 eV to 5.2 eV.
 9. The semiconductor device according to claim 1, further comprising: a fin-shaped semiconductor layer on a semiconductor substrate; and a first insulating film around the fin-shaped semiconductor layer, wherein the first pillar-shaped semiconductor layer is on the fin-shaped semiconductor layer, the first gate insulating film is around the gate electrode and the gate line and on bottom portions of the gate electrode and the gate line, the gate line extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends, and the second diffusion layer further resides in the fin-shaped semiconductor layer.
 10. The semiconductor device according to claim 9, wherein the second diffusion layer further resides in the semiconductor substrate.
 11. The semiconductor device according to claim 9, further comprising a contact line parallel to the gate line and connected to the second diffusion layer.
 12. The semiconductor device according to claim 11, further comprising: a second pillar-shaped semiconductor layer on the fin-shaped semiconductor layer; and a contact electrode made of a metal and around the second pillar-shaped semiconductor layer, wherein the contact line is made of a metal and extends in a direction perpendicular to a direction in which the fin-shaped semiconductor layer connected to the contact electrode extends, the second diffusion layer is in the fin-shaped semiconductor layer and in a lower portion of the second pillar-shaped semiconductor layer, and the contact electrode is connected to the second diffusion layer.
 13. The semiconductor device according to claim 9, wherein an outer width of the gate electrode is equal to a width of the gate line, and a width of the first pillar-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends is equal to a width of the fin-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends.
 14. The semiconductor device according to claim 12, wherein the first gate insulating film is between the second pillar-shaped semiconductor layer and the contact electrode.
 15. The semiconductor device according to claim 12, wherein a width of the second pillar-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends is equal to a width of the fin-shaped semiconductor layer in a direction perpendicular to a direction in which the fin-shaped semiconductor layer extends.
 16. The semiconductor device according to claim 14, wherein the first gate insulating film is around the contact electrode and the contact line.
 17. The semiconductor device according to claim 12, wherein an outer width of the contact electrode is equal to a width of the contact line.
 18. The semiconductor device according to claim 1, wherein the first pillar-shaped semiconductor layer is on a semiconductor substrate, the first gate insulating film is around the gate electrode and the gate line and on bottom portions of the gate electrode and the gate line, and the second diffusion layer further resides in the semiconductor substrate. 